publications
publications by categories in reversed chronological order.
2024
- Advancing Sustainable Mobility: A Data Acquisition System for Light Vehicles and Active MobilityElectronics, Oct 2024
- Empowering Smart Mobility with a Component-based Data Acquisition System for Multi-sensor ReadoutIn 2024 19th Conference on Ph.D Research in Microelectronics and Electronics (PRIME) , Jun 2024
- Low-Noise Wide Dynamic Range Charge Sensitive Amplifier in 65 nm CMOS Technology for the Second Flight of the GAPS ExperimentIn 2024 19th Conference on Ph.D Research in Microelectronics and Electronics (PRIME) , Jun 2024
- Energy threshold calibration of the GAPS experiment Si tracker readout electronicsIl Nuovo Cimento C, Feb 2024
2023
- Experimental results from the characterization of a 32-channels mixed-signal processor for the GAPS experiment2023 IEEE NSS/MIC RTSD - IEEE Nuclear Science Symposium, Medical Imaging Conference and Room Temperature Semiconductor Detector Conference, Nov 2023
- Characterisation of the pFREYA16 ASIC for low-noise ptychography applications2023 IEEE NSS/MIC RTSD - IEEE Nuclear Science Symposium, Medical Imaging Conference and Room Temperature Semiconductor Detector Conference, Nov 2023
- A 32-Channel Readout ASIC for X-Ray Spectrometry and Tracking in the GAPS ExperimentIEEE Transactions on Nuclear Science, Nov 2023
- A mixed-signal processor for X-ray spectrometry and tracking in the GAPS experimentNuclear Instruments and Methods in Physics Research, Section A: Accelerators, Spectrometers, Detectors and Associated Equipment, Jan 2023
2022
- A Low-Noise Readout Channel for X-Ray Ptychography Applications2022 IEEE NSS/MIC RTSD - IEEE Nuclear Science Symposium, Medical Imaging Conference and Room Temperature Semiconductor Detector Conference, Nov 2022
- The 32 Analog Channels Readout for the Long-Flight GAPS Balloon Experiment Tracking SystemLecture Notes in Electrical Engineering, Sep 2022
- FALCON readout channel for X-ray ptychography applicationsPRIME 2022 - 17th International Conference on Ph.D Research in Microelectronics and Electronics, Proceedings, Jun 2022